(Stacked Trace Picker)
This window is used for two things - refining the source and detector delay times and finding bad sources and detectors.
Each trace in the window below is (in this case) a stacked shot. All of the traces belonging to a shot that fall within the selected branch (refractor) have LMO and delay time shifts applied and stacked.
Shift-clicking on a trace selects the source gather (or detector gather) in the picker window.
Use of this window requires a valid delay time and velocity model.
Computing the stacks is very fast - about 1 minute per 500,000 traces.